Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2011-07-19
2011-07-19
Velez, Roberto (Department: 2858)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
Reexamination Certificate
active
07982485
ABSTRACT:
It is possible to provide a semiconductor test device capable improving the test efficiency. The semiconductor test device includes: a driver (14) which generates a driver signal outputted to a device under test; a variable delay circuit (12) provided at the preceding stage of the driver (14); a register (16) for setting an output level of a driver signal outputted from the driver (14); a correction value memory (26) which outputs correction data corresponding to a shift of the rise timing or the fall timing of the driver signal when the output level is modified from a predetermined value serving as a reference value of the output level; an amplitude correction value register (28) which sets a delay amount by a variable delay circuit (12) by considering correction data which is outputted from the correction value memory (26); an adder circuit (30).
REFERENCES:
patent: 6479983 (2002-11-01), Ebiya
patent: 11-38087 (1999-02-01), None
patent: 11-337627 (1999-12-01), None
patent: 2004-020408 (2004-01-01), None
Advantest Corporation
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Velez Roberto
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