Semiconductor device, manufacturing method of the...

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified material other than unalloyed aluminum

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257S642000, C257S759000, C257S760000, C257SE23142, C257SE23145

Reexamination Certificate

active

07863745

ABSTRACT:
A semiconductor device, including a semiconductor substrate where a plurality of functional elements is formed; and a multilayer interconnection layer provided over the semiconductor substrate, the multilayer interconnection layer including a wiring layer mutually connecting the plural functional elements and including an interlayer insulation layer, wherein a region where the wiring layer is formed is surrounded by a groove forming part, the groove forming part piercing the multilayer interconnection layer; and the groove forming part is filled with an organic insulation material.

REFERENCES:
patent: 6617655 (2003-09-01), Estacio et al.
patent: 6952048 (2005-10-01), Terui
patent: 7067922 (2006-06-01), Hasunuma et al.
patent: 7285867 (2007-10-01), Matsuzaki et al.
patent: 7489032 (2009-02-01), Jobetto
patent: 2004/0094841 (2004-05-01), Matsuzaki et al.
patent: 2004/0238926 (2004-12-01), Obinata
patent: 2005/0035469 (2005-02-01), Yoshida et al.
patent: 2005/0161799 (2005-07-01), Jobetto
patent: 2006/0220247 (2006-10-01), Hanaoka
patent: 2008/0006910 (2008-01-01), Miyata et al.
patent: 59-43557 (1984-03-01), None
patent: 4-283950 (1992-10-01), None
patent: 2000-277463 (2000-10-01), None
patent: 2002-289740 (2002-10-01), None
patent: 2004-296905 (2004-10-01), None
patent: 2004-349610 (2004-12-01), None
patent: 2005-32782 (2005-02-01), None
patent: 200414382 (2004-08-01), None
patent: 200527647 (2006-08-01), None
patent: WO 2006054606 (2006-05-01), None
Official Letter in the Office Action issued Sep. 9, 2009 in the corresponding Taiwanese patent application No. 095141873.
Japanese Office Action dated Oct. 19, 2010, issued in corresponding Japanese Patent Application No. 2006-161128 (With Partial Translation).

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Semiconductor device, manufacturing method of the... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor device, manufacturing method of the..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device, manufacturing method of the... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2651178

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.