System and method for making photomasks

Computer-aided design and analysis of circuits and semiconductor – Design of semiconductor mask or reticle – Manufacturing optimizations

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C716S055000

Reexamination Certificate

active

07984393

ABSTRACT:
The present disclosure is directed a method for preparing photomask patterns. The method comprises receiving drawn pattern data for a design database, the drawn pattern data describing device circuit features and dummy features. The dummy features have first target patterns. Mask pattern data is generated for the dummy features, wherein one or more of the dummy features have second target patterns that are different from the first target patterns. The mask pattern data is corrected for proximity effects.

REFERENCES:
patent: 6764795 (2004-07-01), Aton et al.
patent: 7435512 (2008-10-01), Chang
patent: 2005/0106473 (2005-05-01), Huang
patent: 2006/0210889 (2006-09-01), Fujimoto
patent: 2007/0174802 (2007-07-01), Shin et al.
Aton, U.S. Appl. No. 11/771,515, filed Jun. 29, 2007.
Aton, U.S. Appl. No. 11/940,990, flied Nov. 15, 2007.
Aton et al., U.S. Appl. No. 11/940,245, filed Nov. 14, 2007.
Aton, U.S. Appl. No. 11/863,753, filed Sep. 28, 2007.
Aton et al., U.S. Appl. No. 11/940,194, filed Nov. 14, 2007.
Aton, U.S. Appl. No. 11/863,717, filed Sep. 28, 2007.
Aton et al., U.S. Appl. No. 11/940,270, filed Nov. 14, 2007.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

System and method for making photomasks does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with System and method for making photomasks, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System and method for making photomasks will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2643869

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.