Measuring and testing – Specimen stress or strain – or testing by stress or strain... – Specified electrical sensor or system
Reexamination Certificate
2011-07-19
2011-07-19
Caputo, Lisa M (Department: 2855)
Measuring and testing
Specimen stress or strain, or testing by stress or strain...
Specified electrical sensor or system
Reexamination Certificate
active
07980138
ABSTRACT:
An integrated circuit includes a semiconductor die, and a stress sensing element. The stress sensing element comprises a first lateral resistor and a first vertical resistor. The stress sensing element is formed in the semiconductor die and is configured to indicate a level of at least one stress component within the semiconductor die.
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Caputo Lisa M
Davis Octavia
Dicke Billig & Czaja, PLLC
Infineon - Technologies AG
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