Integrated circuit with stress sensing element

Measuring and testing – Specimen stress or strain – or testing by stress or strain... – Specified electrical sensor or system

Reexamination Certificate

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Reexamination Certificate

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07980138

ABSTRACT:
An integrated circuit includes a semiconductor die, and a stress sensing element. The stress sensing element comprises a first lateral resistor and a first vertical resistor. The stress sensing element is formed in the semiconductor die and is configured to indicate a level of at least one stress component within the semiconductor die.

REFERENCES:
patent: 3336795 (1967-08-01), Kiyoshi
patent: 6906514 (2005-06-01), Ausserlechner
patent: 7255010 (2007-08-01), Ausserlechner
patent: 2005/0162160 (2005-07-01), Ausserlechner et al.
patent: 2005/0211980 (2005-09-01), Fischer et al.
patent: 2007/0018655 (2007-01-01), Ausserlechner et al.
patent: 2007/0063309 (2007-03-01), Ausserlechner
patent: 2007/0176182 (2007-08-01), Wen et al.
patent: 10154497 (2003-05-01), None
patent: 102004034277 (2006-02-01), None
patent: 102005008724 (2006-09-01), None
patent: 102005008772 (2006-09-01), None
U. Ausserlechner article entitled “Stabiler Hallsonden IC;” © 2004; 2 pgs.
U. Ausserlechner article entitled “MOS-Stress-Sensor;” © 2005; 2 pgs.
U. Ausserlechner article entitled “Oszillator Stress-Sensor;” © 2005; 4 pgs.
Dr. Udo Ausserlechner, article entitled “Oscillator Stress Sensor,” 6 pgs.; © 2005.
Udo Ausserlechner, article entitled “Stable Hall Probe IC,” 3 pgs.; © 2004.
Dr. Udo Ausserlechner, article entitled “MOS-Stress-Sensor,” 5 pgs.; © 2005.

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