Fluorescence microscope

Optical: systems and elements – Compound lens system – Microscope

Reexamination Certificate

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C359S385000, C356S318000

Reexamination Certificate

active

08000003

ABSTRACT:
The invention provides a fluorescence microscope and a method for using this to measure fluorescence. The microscope comprises a silicon wafer filter membrane which is highly-planar and does not fluoresce. Moreover, it has a very high perforation density, so that a small surface area is sufficient for effective measurement. Using a camera as the location-sensitive detector moreover makes it possible to take advantage of better optical resolution, which means that optics having a smaller numerical aperture and a smaller magnification factor can be employed, with a greater working distance. All these factors together provide a fluorescence microscope capable of much more rapid measurements than the existing fluorescence microscopes.

REFERENCES:
patent: 5149972 (1992-09-01), Fay et al.
patent: 5753014 (1998-05-01), Van Rijn
patent: 2002/0043625 (2002-04-01), Shimizu et al.
patent: 2003/0218746 (2003-11-01), Sampas
patent: 2005/0046836 (2005-03-01), Olschewski
patent: 2005/0111090 (2005-05-01), Kleinteich et al.
patent: 2005/0237605 (2005-10-01), Vodyanoy et al.
patent: 0539888 (1993-05-01), None
Van Dijk, B.; Miljarden gaatjes als businessmodel; Het Financieele Dagblad, Dec. 30, 2003; p. 18.

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