Successive approximate capacitance measurement circuit

Details Successive approximate capacitance measurement circuit Successive approximate capacitance measurement circuit

2011-02-08

2011-02-08

Nguyen, Hoai-An D (Department: 2831)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

C324S678000, C324S686000

Reexamination Certificate

active

07884621

ABSTRACT:
A capacitance measurement circuit includes a current source, a switch, and a comparator. The current source is coupled to drive a current through a circuit node. The switch is coupled to the circuit node to switch the current into a device under test (“DUT”) capacitor. The comparator includes first and second input ports. The comparator is coupled to compare a first voltage received on the first input port against a reference voltage received on the second input port. The first voltage is related to the current driven through the circuit node, a frequency at which the switch is switched, and a capacitance of the DUT capacitor.

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