Semiconductor integrated circuit and operation method for...

Miscellaneous active electrical nonlinear devices – circuits – and – External effect – Temperature

Reexamination Certificate

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C327S539000, C327S540000

Reexamination Certificate

active

07948298

ABSTRACT:
The semiconductor integrated circuit is provided, in which an external temperature control or temperature monitoring is possible, with little influence by the noise of a system board which mounts the semiconductor integrated circuit. The semiconductor integrated circuit includes the temperature detection circuit which detects the chip temperature, and the functional module which flows a large operating current. An external terminal which supplies operating voltage, and an external terminal which supplies ground voltage are coupled to the functional module. The temperature detection circuit generates a temperature detection signal and a reference signal. The reference signal and the temperature detection signal are led out to the exterior of the semiconductor integrated circuit via a first external output terminal and a second external output terminal, respectively, and are supplied to an external temperature control/monitoring circuit which has a circuitry type of a differential amplifier circuit.

REFERENCES:
patent: 6803803 (2004-10-01), Starr et al.
patent: 6982915 (2006-01-01), Houston et al.
patent: 7205755 (2007-04-01), Ito et al.
patent: 2006-286678 (2006-10-01), None
MXA1617 data sheet “Remote/Local Temperature Sensor with SMBus Serial Interface” pp. 1-20, 19-1265; Rev 1; Mar. 1998.
LM89 data sheet “LM89±0.75° C. Accurate, Remote Diode and Local Digital Temperature Sensor with Two-Wire Interface” Dec. 2004, National Semiconductor Corporation.

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