Alignment adjusting mechanism and measuring instrument

Geometrical instruments – Gauge – Having a movable contact probe

Reexamination Certificate

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Details

C033S559000

Reexamination Certificate

active

07882644

ABSTRACT:
An alignment mechanism includes: an adjusting plate having first and second adjustment ends parallel to an X axis direction; a probe fixing portion provided to the adjusting plate; a probe fixed to the probe fixing portion; a reinforcing plate having first and second base ends parallel to the X axis direction, displacement of the reinforcing portion in a Y axis direction being restricted; Y-direction adjusting screws for pressing the adjusting plate in the Y axis direction; and adjustment connectors for respectively connecting the first adjustment end with the first base end and the second adjustment end with the second base end. A stylus of the probe is disposed on a line of intersection of a first inclined surface including the first adjustment end and the first base end and a second inclined surface including the second adjustment end and the second base end.

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patent: 7222434 (2007-05-01), Kikuchi
patent: 7607234 (2009-10-01), Tada et al.
patent: 7698829 (2010-04-01), Lutz
patent: 2003/0019119 (2003-01-01), Sato et al.
patent: 2010/0132432 (2010-06-01), Wallace et al.
patent: 2010/0146802 (2010-06-01), Ehlerding
patent: 11-142141 (1999-05-01), None
patent: 2003-057026 (2003-02-01), None

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