System and method for accessing a test vector memory

Excavating

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G06F 1100

Patent

active

058257870

ABSTRACT:
An improved circuit tester allows for increased storage of test vectors in existing memory structures by noting where segments of test vectors repeat and storing such segments only once, then further utilizing memory space corresponding to otherwise unused test channels. Switching circuitry is included to selectively forward signals to and from a designated, multi-source conductor.

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