Laser systems for material analysis based on reflectance ratio d

Details Laser systems for material analysis based on reflectance ratio d Laser systems for material analysis based on reflectance ratio d

1990-02-02

1991-10-08

Willis, Davis L.

Surgery

Truss

Pad

356 39, 25022723, A61B 500, G01N 3348

Patent

active

050544870

ABSTRACT:
Systems and methods for non-invasive material analysis are disclosed in which a material (e.g., a liquid such as blood) is illuminated at a plurality of discrete wavelengths. Measurements of the intensity of reflected light at such wavelengths are taken, and an analysis of reflection ratios for various wavelengths is performed. Changes in the reflection ratios can be correlated with specific material properties such as the concentration of analytes (e.g., oxygen content, glucose levels, cholesterol or drugs in a subject's circulatory system).

REFERENCES:
patent: 4785814 (1988-10-01), Kane
patent: 4796636 (1989-01-01), Brenstetter et al.
patent: 4854699 (1989-08-01), Edgar Jr.

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