Arrangement and method for operating and testing an optical devi

Details Arrangement and method for operating and testing an optical devi Arrangement and method for operating and testing an optical devi

1996-08-16

1998-10-20

Hellner, Mark

Optical: systems and elements

Optical amplifier

359110, 359180, 356 72, 356 73, 356 731, H01S 300, G01N 2100

Patent

active

058255303

ABSTRACT:
This invention relates particularly to an arrangement for operating and testing in the field of optical communication networks and to an arrangement and a method for an operational test of optical devices, such as erbium-doped fiber amplifiers (EDFAs). The device under test is connected via optical fibers with a tunable laser and an optical signal analyzer. A pattern generator controls the tunable laser to generate a set of signals with different wavelengths .lambda.1 to .lambda.4, one after the other, within the recovery time of the device under test. Thereby, the operational behavior of a device under test, having a recovery time, and which is applied to several signals with different wavelengths present at the same time, can be tested by a single tunable laser.

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Journal of Lightwave Technology, vol. 7, No. 4, Apr. 1989, pp. 615-624, Frenkel et al., "Angle-Tuned Etalon Filters for Optical Channel Selection in High Density Wavelength Division Multiplexed Systems".
EPO Search Report, EP 96 10 8813, dtd 19 Dec. 1996.
Proceedings of Trends in Optical Fibre Metrology and Standards (NATO), 27 Jun. 1994-8 Jul. 1994, pp. 511-525 SP000609657, Malzahn, "EDFA Testing".
Hewlett-Packard Journal, vol. 44, No. 1, Feb. 1993, pp. 11-19, SP 000359156, Maisenbacher et al., "Tunable Laser Sources for Optical Amplifier Testing".

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