Semiconductor integrated circuit device

Details Semiconductor integrated circuit device Semiconductor integrated circuit device

1995-12-18

1998-10-20

Nguyen, Vinh P.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324760, 324765, G01R 3128

Patent

active

058251936

ABSTRACT:
A semiconductor integrated circuit apparatus having a plurality of semiconductor integrated circuit devices, each of the plurality of semiconductor devices including a semiconductor integrated circuit formed on a semiconductor substrate, a reference voltage input terminal formed on the semiconductor substrate which is operative for receiving a reference voltage input from outside of the semiconductor substrate, and a burn-in voltage control circuit formed on the semiconductor substrate operative for receiving the reference voltage which is output from the reference voltage input terminal. The burn-in voltage control circuit generates a burn-in supply voltage which is input to the semiconductor integrated circuit, and also maintains the burn-in supply voltage at the reference voltage level such that each of the integrated circuits receives a burn-in supply voltage having the same voltage level.

REFERENCES:
patent: 4636725 (1987-01-01), Santomango et al.
patent: 5315167 (1994-05-01), Chan et al.
patent: 5349290 (1994-09-01), Yamada
patent: 5365250 (1994-11-01), Hirashima
patent: 5371457 (1994-12-01), Lipp
patent: 5392293 (1995-02-01), Hsue
patent: 5404099 (1995-04-01), Sahara
patent: 5448199 (1995-09-01), Park

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