Ultrasonic probe for testing the material of slotted or hollow p

Details Ultrasonic probe for testing the material of slotted or hollow p Ultrasonic probe for testing the material of slotted or hollow p

1988-03-18

1989-09-05

Budd, Mark O.

Electrical generator or motor structure

Non-dynamoelectric

Piezoelectric elements and devices

310335, 310336, 310367, 73642, 73644, 73661, H01L 4108

Patent

active

048641782

ABSTRACT:
An ultrasonic probe 1 for non-destructive material testing of slotted or hollowed pieces of material 2 and comprising a carrier 3 and a probe part 4 connected to said carrier, which probe part is formed with one or several piezo-electric crystals 5 provided at or adjacent the tip thereof and mounted at an angle to the longitudinal plane of the probe of between 45.degree. and 50.degree. and rotated around its own axis over an angle of about 45.degree.-47.degree.. The probe can be formed with two or several symmetrically arranged piezo-electric crystals for allowing a complete testing of the piece of material by one single docking operation in that the different crystals are connected in turn after each other. Further the probe may also be formed with one or several straight scanning piezo-electric crystals 6 mounted in the carrier 3.

REFERENCES:
patent: 3159023 (1964-12-01), Steinbrecher
patent: 4361044 (1982-11-01), Kupperman et al.
patent: 4388831 (1983-06-01), Sherman
patent: 4430593 (1984-04-01), Gohlert et al.
patent: 4577505 (1986-02-01), Jestrich et al.
patent: 4593568 (1986-06-01), Telford et al.
patent: 4619143 (1986-10-01), Franklen
patent: 4640131 (1987-02-01), Kroning et al.
patent: 4641529 (1987-02-01), Lorenzi et al.
patent: 4699150 (1987-10-01), Kawabuchi et al.
patent: 4763513 (1958-08-01), Zacharias

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