Optics: measuring and testing – By polarized light examination
Patent
1997-12-23
1999-08-31
Pham, Hoa Q.
Optics: measuring and testing
By polarized light examination
356369, G01N 2121
Patent
active
059460989
ABSTRACT:
Disclosed are optical elements for use in ellipsometer/polarimeter systems which do not introduce significant deviation and/or displacement into the propagation direction of a beam of electromagnetic radiation caused to interact therewith, even when said optical elements are caused to continuously rotate. Specifically disclosed is a Polarizer system with a high extinction ratio which can be used at infrared wavelengths, as well as a number of retarder systems with retardation vs. wavelength dispersion characteristics which are within a range of acceptability. In addition, certain disclosed optical elements demonstrate limited immunity to beam alignment changes.
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Green Steven E.
Herzinger Craig M.
Johs Blaine D.
J.A. Woollam Co. Inc.
Pham Hoa Q.
Welch James D.
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