Electricity: measuring and testing – Magnetic – Displacement
Patent
1990-12-05
1992-05-19
Strecker, Gerard R.
Electricity: measuring and testing
Magnetic
Displacement
32420716, 32420724, 336 45, 336179, G01B 714, H01F 1516, H01F 2106
Patent
active
051151936
ABSTRACT:
A transducer system is provided including an inductive linear displacement transducer connected to a temperature-compensating signal processor. The signal processor includes (a) an amplitude-variable, frequency-stable device providing a modulated D.C. current through the transducer, (b) a temperature-sensitive element connected in series between the transducer and the current-providing device such that it is subjected to substantially the same temperature as the transducer, and (c) a signal processing circuit coupled to the temperature-sensitive element. The temperature-sensitive element has a high temperature coefficient so that temperature changes have a substantial effect on the DC offset of the signal coming from the temperature-sensitive element, and a low dynamic resistance so that temperature changes have substantially no effect on the amplitude of the signal coming from the temperature-sensitive element. The signal processing circuit (1) detects changes in the DC offset of the signal coming from the temperature-sensitive element and generates a signal used as the input to the current-providing device to adjust the amplitude of the modulation of the current in compensation for changes in the amplitude of the signal coming from the transducer due to temperature changes; and (2) monitors the amplitude component of the signal coming from the temperature-sensitive element and provides an output signal reflective of the linear displacement of an object connected to the transducer.
REFERENCES:
patent: 3707671 (1972-12-01), Morrow et al.
patent: 4667158 (1987-05-01), Redlich
patent: 4797614 (1989-01-01), Nelson
patent: 4864232 (1989-09-01), Redlich
patent: 4866378 (1989-09-01), Redlich
patent: 4912409 (1990-03-01), Redlich et al.
patent: 4954776 (1990-09-01), Husher
Bean Orville E.
Weber Daniel R.
Data Instruments, Inc.
Strecker Gerard R.
LandOfFree
Inductive linear displacement transducer and temperature-compens does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Inductive linear displacement transducer and temperature-compens, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Inductive linear displacement transducer and temperature-compens will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2418603