Method of making count probe with removable count wafer

Metal working – Method of mechanical manufacture – Assembling or joining

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Details

324 714, B23P 1902

Patent

active

054329922

ABSTRACT:
A method of making a count probe comprises the following steps. A member is made having a conduit and an opening. A wafer is made including an aperture. The wafer is removably inserted into the opening such that the wafer is removably retained within the opening by an interference fit between the wafer and the member.

REFERENCES:
patent: 3122431 (1964-02-01), Coulter et al.
patent: 3266526 (1966-08-01), Berg
patent: 3361965 (1968-01-01), Coulter et al.
patent: 3395343 (1968-07-01), Morgan et al.
patent: 3395344 (1968-07-01), Bader
patent: 3444464 (1969-05-01), Coulter et al.
patent: 3515884 (1970-06-01), Imadate
patent: 3539919 (1970-11-01), Hogg
patent: 3554037 (1971-01-01), Berg
patent: 3614607 (1971-10-01), Schoen
patent: 3628140 (1971-12-01), Hogg et al.
patent: 3638677 (1972-02-01), Baccarini
patent: 3648158 (1972-03-01), Parker
patent: 3714565 (1973-01-01), Coulter et al.
patent: 3739258 (1973-06-01), Karuhn et al.
patent: 3746976 (1973-07-01), Hogg
patent: 3771058 (1973-11-01), Hogg
patent: 3779279 (1973-12-01), Schon
patent: 3783376 (1974-01-01), Doniguian
patent: 3859012 (1975-01-01), Hogg
patent: 3864628 (1975-02-01), Klass et al.
patent: 3902115 (1975-08-01), Hogg et al.
patent: 3939409 (1976-02-01), Hogg
patent: 3958177 (1976-05-01), Reeves et al.
patent: 3976429 (1976-08-01), Ginsberg
patent: 4014611 (1977-03-01), Simpson et al.
patent: 4140966 (1979-02-01), Godin et al.
patent: 4157498 (1979-06-01), Johnson
patent: 4325913 (1982-04-01), Wardlaw
patent: 4395676 (1983-07-01), Hollinger et al.
patent: 4461181 (1984-07-01), North, Jr.
patent: 4484134 (1984-11-01), Halloran
patent: 4491786 (1985-01-01), Godin
patent: 4710021 (1987-12-01), Von Behrens
patent: 4730155 (1988-03-01), Hogg
patent: 4760328 (1988-07-01), Groves
patent: 4853618 (1989-08-01), Holley
patent: 5007296 (1991-04-01), Hukuhara

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