Ion implantation system

Radiant energy – Irradiation of objects or material – Irradiation of semiconductor devices

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Details

250442, H01J 3700, B01D 5944

Patent

active

042582660

ABSTRACT:
The ion implantation system includes a separate vacuum housing 102 for the ion source and the target chamber 118. The ribbon beam ion source 10 provides a footprint 162 on the wafer wheel 126 of such shape as to permit short traverse of the wafer wheel 126 for full wafer scan.

REFERENCES:
patent: 3689766 (1972-09-01), Freeman
patent: 3778626 (1973-12-01), Robertson
patent: 3983402 (1976-09-01), Arndt et al.
patent: 4017403 (1977-04-01), Freeman
patent: 4163151 (1979-07-01), Bayless et al.

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