Reflection type imaging optical system

Optical: systems and elements – Mirror – Plural mirrors or reflecting surfaces

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Details

359859, 359366, 359584, 378 84, 378147, G02B 510, G02B 200

Patent

active

056193823

ABSTRACT:
A reflection type imaging optical system is provided with at least one reflecting mirror, whose reflecting surface is constructed of a plurality of zone areas different from each other in spectral reflectance characteristics. Further, in the optical system, the spectral reflectance characteristics of each zone area are selected so that an incident angle providing the maximum reflectance when a ray of light of a predetermined wavelength is incident on each zone area has a value between the maximum and the minimum of the incident angle in the zone area. The reflection type imaging optical system thus provides an important advantage in practical use in that the reflection efficiency of each reflecting surface is enhanced to bring about the brightness necessary for the imaging surface.

REFERENCES:
patent: 4026641 (1977-05-01), Bosserman et al.
patent: 4318089 (1982-03-01), Frankel et al.
patent: 4320164 (1982-03-01), Nicolas et al.
patent: 4444464 (1984-04-01), Minott
patent: 4497540 (1985-02-01), Breckinridge et al.
patent: 4695139 (1987-09-01), Bagby et al.
patent: 4770824 (1988-09-01), Blom
patent: 4790654 (1988-12-01), Clarke
patent: 4798446 (1989-01-01), Hettrick
patent: 4916721 (1990-04-01), Carr et al.
patent: 4919527 (1990-04-01), Saiylou et al.
patent: 4925271 (1990-05-01), Taniura
patent: 4927256 (1990-05-01), Lacuve
patent: 4941163 (1990-07-01), Hoover
patent: 4964706 (1990-10-01), Cook
patent: 5144497 (1992-09-01), Kato et al.
Ream; "A Convex Beam Integrator"; Laser Focus, vol. 15; No. 11, Nov. 1979; pp. 68-72.
Barbee et al "Layered Synthetic Microstructures: Properties and Applications in X-Ray Astronomy"; SPIE vol. 184 Space Optics -Imaging X-Ray Optics Workshop (1979); pp. 123-130.
Underwood et al; "Layered Synthetic Microstructures as Bragg Diffractors For X Rays and Extreme Ultraviolet: Theory and Predicted Performance"; Applied Optics, vol. 20, No. 17, Sep. 1981 pp. 3027-3034.
Takeshi Namioka, Journal of the Japan Society of Precision Engineering, 52/11/1986, p. 1843.
Takeshi Namioka, Kagaku-Kenkyuhi Hojokin Kenkyu-Seika Hokokusho (1985).
Lawrence Mertz, Geometrical Design for Aspheric Reflecting Systems, Applied Optics/Dec. 15, 1979/vol. 18, No. 24 pp. 4182-4186.
B.L. Henke, P. Lee, T.J. Tanaka, R.L. Shimabukuro, and B.K. Fujikawa; Low-Energy X-Ray Interaction Coefficients: Photoabsorption, Scattering, and Reflection, Atomic Data and Nuclear Data Tables, vol. 27, No. 1,/ Jan. 1, 1982.

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