Method for automatic guard selection in automatic test equipment

Details Method for automatic guard selection in automatic test equipment Method for automatic guard selection in automatic test equipment

1986-03-14

1988-09-27

Eisenzopf, Reinhard J.

Electricity: measuring and testing

Plural, automatically sequential tests

324158R, 371 15, 371 20, G01R 3128

Patent

active

047744553

ABSTRACT:
During the testing of circuit boards with Automatic Test Equipment in some circuit configurations the performance of a component may not be as expected even though it is sound due to the influence of surrounding components. In such a situation guards may be placed, that is further signals via probes contacting nodes other than those to which the component is connected, so that such disruption may be minimized. A method for defining guards during the operation of automatic test equipment so that a selected component of a circuit may be tested includes establishing a measurement of the selected component in a known to be good circuit of the type to be tested. A circuit node associated with the selected component is identified and a guard is applied to the node. A second measurement is established with the selected guard in place. If the guard results in an improvement, it is retained during subsequent automatic testing.

REFERENCES:
patent: 3931506 (1976-01-01), Borrelli et al.
patent: 4070565 (1978-01-01), Borrelli
patent: 4555783 (1985-11-01), Swanson
Mesures-Regulation-Automatisme, Nov. 1981, by J-F Peyrucat, pp. 7, 9, 11, 13, 15, 17, 21, 25, 28, 29, 31, 33, 35.
"Zero in on Analog Faults with Guarded-Probe ATE Diagnostic", by S. L. Black, Electronic Design, vol. 27, No. 21, (1979).

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