Probe for providing surface images

Details Probe for providing surface images Probe for providing surface images

1993-05-04

1994-10-18

Gutierrez, Diego F. F.

Thermal measuring and testing

Temperature measurement

In spaced noncontact relationship to specimen

374137, 374141, 250330, G01J 502, G01J 512

Patent

active

053562186

ABSTRACT:
A probe (10,30,40) for forming images of surfaces (11) facilitates simultaneous formation of both thermal and atomic force microsocopy images. The probe (10,30,40) includes a heat sensing assembly (15) that has a heat sensing element (19,38,42). An electrically isolating and thermally conductive tip (22,48) projects from the heat sensing assembly. The probe (10) also has a reflective element (24) that is positioned between a first end of the heat sensing assembly (15) and the electrically isolating and thermally conductive tip (22).

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