Computed tomography inspection of electronic devices

Details Computed tomography inspection of electronic devices Computed tomography inspection of electronic devices

1988-05-13

1989-07-25

Church, Craig E.

X-ray or gamma ray systems or devices

Specific application

Computerized tomography

378 17, 378 58, H05G 160

Patent

active

048521310

ABSTRACT:
Computed tomography inspection apparatus and method of inspecting electronic devices and features of PCBs/PWBs, such as solder bonds, tracings and vias. The system scans radiation passed through the devices in thin slices and detects attenuated radiation from which it generates data representing slice images with high resolution. The detected image data are analyzed automatically by an image data analyzer which receives model data against which it compares and evaluates the detected image data.

REFERENCES:
patent: 3454762 (1969-07-01), Vollmer
patent: 3573455 (1971-04-01), Suierveld
patent: 3889122 (1975-06-01), Fletcher
patent: 3995162 (1976-11-01), Peterson

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