Thick extended contact photoconductor

Electrical resistors – Resistance value responsive to a condition – Photoconductive

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338 17, 250211J, H01L 3108

Patent

active

044828810

ABSTRACT:
A semiconductor photoconductor having low impedance nonmetallic contacts is disclosed which has increased detectivity over prior art photoconductor structures. The improved photoconductor has metallic contacts that are separated by a contact length that is greater than the optical length of the detector. The contact regions of the semiconductor adjacent the detector region are thicker than the detector region. The process for fabricating the photoconductor includes thinning the detector region to an appropriate thickness while preserving the greater thickness of the contact regions.

REFERENCES:
patent: 3523188 (1970-08-01), Kazan et al.
patent: 3968360 (1976-07-01), Monnier
patent: 3988612 (1976-10-01), Palmer
patent: 4025793 (1977-05-01), Shaw et al.
patent: 4307372 (1981-12-01), Matsui et al.
Kinch et al., "Geometrical Enhancement of HgCdTe Photoconductive Detectors", Infrared Physics, 1977, vol. 17, pp. 137-145.

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