Semiconductor integrated circuit device

Details Semiconductor integrated circuit device Semiconductor integrated circuit device

1988-02-05

1990-05-08

Fleming, Michael R.

Excavating

371 161, G06F 304

Patent

active

049244698

ABSTRACT:
In a system including LSIs, the signature register used for self-testing the LSI functions is assigned to one register accessible by a machine instruction. The signature is calculated in the self-test operation, and the calculation result is updated depending on the result from the execution of the machine instruction. With the above technical idea, the test function for the LSI function is available not only for the test mode, but also for the normal operation. This simplifies the self-test program for testing the functions of the application system.

REFERENCES:
patent: 4534030 (1985-08-01), Paez
patent: 4601033 (1986-07-01), Whelan
patent: 4780874 (1988-10-01), Lenoski
patent: 4799004 (1989-01-01), Mori
Konemann et al., "Built-In Test for Complex Digital Integrated Circuits," IEEE Journal of Solid-State Circuits, vol. SC-15, No. 3, pp. 315-319, Jun. 1980.

Affiliated with

Also associated with

Rating

Semiconductor integrated circuit device does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor integrated circuit device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor integrated circuit device will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2355284