Linear feedback shift registers

Details Linear feedback shift registers Linear feedback shift registers

1990-08-08

1992-04-14

Malzahn, David H.

Boots, shoes, and leggings

G06F 102

Patent

active

051053764

ABSTRACT:
A linear feedback shift register has two alternatively selectable feedback configurations enabling the shift register to produce either a pseudo-random state sequence or the reverse of that sequence. The shift register configuration may be characterized by a set of simple parameters and the register is thereby suitable for automatic synthesis.

REFERENCES:
patent: 4845654 (1989-07-01), Harada
patent: 5031130 (1991-07-01), Harada
patent: 5033048 (1991-07-01), Pierce et al.
McCluskey, E. J., "Built-In Self-Test Techniques", I.E.E.E. Design & Test Of Computers, Apr. 1985, pp. 21-28.
McCluskey, E. J., Logical-Design Principles: With Emphasis On Testable Semicustom Circuits, Prentice Hall, 1986, pp. 455-461.
Wang, L. T. and McCluskey, E. J., "Complete Feedback Shift Register Design for Built-In Self-Test", I.E.E.E. 1986 Conference On Computer-Aided Design, Nov. 1986, Santa Clara, CA, pp. 11-13.

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