Semiconductor array having built-in test circuit for wafer level

Details Semiconductor array having built-in test circuit for wafer level Semiconductor array having built-in test circuit for wafer level

1993-07-23

1995-10-10

Karlsen, Ernest F.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

3241581, 324765, 371 225, G01R 3128

Patent

active

054574005

ABSTRACT:
A test circuit is provided for an integrated circuit device, whereby an oscillator is provided on-chip and is activated by a test circuit. The test circuit provides an ability to test the devices while still on the wafer and facilitates burning in the wafer prior to singulating the parts, since it is not necessary to separately establish electrical connections at contact points on the individual integrated circuit devices. The oscillator may be adjusted in speed so that further tests may be effected by changing a test speed through the test circuit. Response of the DUT at different operating speeds is determined by the adjustment of the oscillator speed so that a timing signal used for the testing may be varied.

REFERENCES:
patent: 4079338 (1978-03-01), Kronlage
patent: 4890270 (1989-12-01), Griffith
patent: 4961053 (1990-10-01), Krug
patent: 5047711 (1991-09-01), Smith et al.
patent: 5083299 (1992-01-01), Schwanke et al.
patent: 5099196 (1992-03-01), Longwell et al.

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