Method of fabricating SOI wafer with SiGe as an etchback film in

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257 63, 257 65, 257347, 437 21, 437 62, 437 86, 437974, H01L 2120

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052408760

ABSTRACT:
An SOI wafer is formed having a silicon-germanium layer between the epitaxial layer of the device and the insulative layer. The process includes bonding a second substrate to a silicon-germanium layer on a first substrate by an intermediate insulative layer. The first substrate is removed down to the silicon-germanium layer and the silicon layer is epitaxially formed on the silicon-germanium layer.

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