Method of forming a via having sloped sidewalls

Fishing – trapping – and vermin destroying

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

437194, 437228, 437235, 437978, 437982, 156625, H01L 2144

Patent

active

051622610

ABSTRACT:
A sputter-etch process is used to etch vias having substantially vertical sidewalls, such that a sloped sidewall is formed. Using a silicon dioxide layer in which to form the vias, slopes of approximately 45.degree. may be obtained. A second insulator layer may be provided to protect the leads and other portions of the device during the sputter-etch to prevent damage.

REFERENCES:
patent: 4605470 (1986-08-01), Gwozdz et al.
patent: 4654113 (1987-03-01), Tuchiya et al.
patent: 4775550 (1988-10-01), Chu et al.
patent: 4795722 (1989-01-01), Welch et al.
patent: 4879257 (1989-11-01), Patrick
patent: 4956312 (1990-09-01), Van Laarhoven
patent: 4962063 (1990-10-01), Maydan et al.
patent: 5049525 (1991-09-01), Coleman, Jr.
patent: 5055423 (1991-10-01), Smith et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of forming a via having sloped sidewalls does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of forming a via having sloped sidewalls, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of forming a via having sloped sidewalls will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2292295

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.