Metal treatment – Compositions – Heat treating
Patent
1978-12-13
1980-08-05
Rutledge, L. Dewayne
Metal treatment
Compositions
Heat treating
357 13, 357 20, 357 91, H01L 21265, H01L 2126
Patent
active
042160308
ABSTRACT:
A semiconductor component is described which includes two zones of opposite conductivity type having a pn junction therebetween, and in which one zone is formed of a monocrystalline semiconductor substrate body and the other zone is produced in the semiconductor body by a doping process, such, for example, as by an implantation or diffusing process. Before the diffusion or implantation takes place, a zone is created at or near the substrate surface which has a disturbed crystal lattice. The diffusion or implantation then takes place through the disturbed zone. A process for producing such a semiconductor component is also described.
The other zone may also be produced after the disturbed crystal lattice is produced in the portion of the substrate body which portion will later become the second zone.
REFERENCES:
patent: 3900345 (1975-08-01), Lesk
patent: 3925106 (1975-12-01), Ku et al.
patent: 4056408 (1977-11-01), Bartko et al.
patent: 4063967 (1977-12-01), Graul et al.
patent: 4081292 (1978-03-01), Aoki et al.
Payne et al., "Fully Ion-Implanted - Transistors" IEEE-Trans. Electron Devices, Ed-21, (1974) 273.
Hofker et al., ". . . B Implantations in Amorphous . . . Si", Rad. Effects, 24 (1975) 223.
Csepregi et al., ". . . Residual Disorder in . . . Si", Rad. Effects, 28 (1976) 227.
Crowder et al., ". . . B Atn . . . in Ion-Implanted Si", Ion Implantation in S/C . . . Ed. Crowder, Plenum, N.Y., 1972, p. 257.
Ryssel et al., "B Doping . . . Amorphous . . . Si . . . Ion-Implantation in S/C . . . " Ed. Crowder, Plenum, N.Y., 1972, p. 215.
Stephen et al., ". . . Ion-Implanted . . . PN Junctions" Rad. Effects, 1 (1971) 73.
Bhatia et al., "Isolation Process . . . " IBM-TDB, 19 (1977) 4171.
Bauer, ". . . B-Implanted Layers in Si . . . "Appl. Phys. Letters, 20 (1972) 107.
Graul Juergen
Mueller Helmut
Roy Upendra
Rutledge L. Dewayne
Siemens Aktiengesellschaft
LandOfFree
Process for the production of a semiconductor component with at does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Process for the production of a semiconductor component with at , we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Process for the production of a semiconductor component with at will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2278936