Method of peeling onions by scalding and cutting

Details Method of peeling onions by scalding and cutting Method of peeling onions by scalding and cutting

1975-09-29

1978-01-10

Bashore, S. Leon

Food or edible material: processes, compositions, and products

Processes

Separating a starting material into plural different...

426509, A23L 1212, A23N 700

Patent

active

040680118

ABSTRACT:
Whole raw onions, as harvested, are cleaned and scalded sufficiently to slicken the membrane interface between the outermost and next inner layers of flesh without appreciably affecting the interfaces between subsequent layers of flesh. The root and stem ends are then cut off, and the outermost layers of flesh of each onion bulb and any outer skin adherant thereto is cut longitudinally along the root-stem axis of the bulb to provide a slit therealong. The so-slit onion bulb is then gripped at opposite sides of and along the slit, and the slit outermost layer of flesh and any adherant skin are pushed downwardly and stripped from the onion bulb, followed by separation of the strippings and the remaining bulb.

REFERENCES:
patent: 1312332 (1919-08-01), Kirino
patent: 1325847 (1919-12-01), Horst
patent: 2277003 (1942-03-01), Polk, Jr.
patent: 2445881 (1948-07-01), Hemmeter
patent: 2556385 (1951-06-01), Allan
patent: 2766794 (1956-10-01), Odale
patent: 2888969 (1959-06-01), Hardesty et al.
patent: 2888969 (1959-06-01), Hardesty et al.
patent: 2979097 (1961-04-01), Rogers et al.
patent: 3623524 (1971-11-01), Buck
patent: 3696848 (1972-10-01), Mellon et al.
patent: 3959506 (1976-05-01), Kunz

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