Circuit tester with coincident sequencing of independently compr

Details Circuit tester with coincident sequencing of independently compr Circuit tester with coincident sequencing of independently compr

1992-06-18

1995-03-28

Voeltz, Emanuel T.

Excavating

324 731, G01R 3128

Patent

active

054024277

ABSTRACT:
Test connectors connect a circuit tester to an electronic device to be tested. The test vector matrix is divided into segments, each segment including one or more columns of the matrix. The unique vector segments within each matrix segment are stored in RAMs, one RAM for each test connector. A driver/comparator applies an electrical signal to some of the test connectors in response to a signal received from its associated RAM and receives an electrical signal on other of the test connectors and compares it to a signal received from the RAM. There is an independent sequencer for each matrix segment, each sequencer addressing the RAMs for that segment. A clock initiates and clocks the sequencers in synchrony to produce the test on the test connectors from the unique test vector segments stored in the RAMs.

REFERENCES:
patent: 4652814 (1987-03-01), Groves et al.

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