Semiconductor device manufacturing: process – Chemical etching – Liquid phase etching
Patent
1999-08-26
2000-10-10
Utech, Benjamin L.
Semiconductor device manufacturing: process
Chemical etching
Liquid phase etching
438754, H01L 21461
Patent
active
061301701
ABSTRACT:
A process and etchant solution for chemical wet etching of thin film metals in the presence of a protected metal. The etching solution has a pH range of about 2.7 to 4.0. The etching solution may include hydrogen peroxide, potassium sulfate, and potassium EDTA, and it reduces or eliminates the incidence of etch-resistant metal without damaging the protected metal.
REFERENCES:
patent: 4491860 (1985-01-01), Lim
patent: 4554050 (1985-11-01), Minford et al.
patent: 4671852 (1987-06-01), Pyke
patent: 4740485 (1988-04-01), Sharpe-Geisler
patent: 4787958 (1988-11-01), Lytle
patent: 4814293 (1989-03-01), Van Oekel
patent: 5041191 (1991-08-01), Watson
patent: 5130275 (1992-07-01), Dion
patent: 5211807 (1993-05-01), Yee
patent: 5462638 (1995-10-01), Datta et al.
David Lawrence D.
Fanti Lisa A.
Blecker Ira D.
Deo Duy-Vu
International Business Machines - Corporation
Utech Benjamin L.
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