Method for forming an improved field isolation structure using o

Fishing – trapping – and vermin destroying

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437 69, 437947, H01L 2176

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056725396

ABSTRACT:
A method for forming a field isolation structure and an improved field isolation structure are provided. The method includes forming a field oxide on a silicon substrate using an ozone enhanced local oxidation of silicon (LOCOS) process. Following formation of the field oxide a surface topography of the field oxide is sloped or tapered by ion milling, dry etching, reactive ion etching or chemical mechanical planarization. With an ozone enhanced LOCOS process, oxidation rates are increased and stress between the field oxide and substrate are reduced. This permits the formation of field isolation structures with reduced lateral encroachment and a smaller bird's beak area. In addition, the sloped topography of the field oxide permits a subsequently deposited conductive layer (e.g., polysilicon) to be etched without the formation of conductive stringers. During the etch process the active areas on the substrate can be protected with a sacrificial oxide or by only partially removing the LOCOS mask.

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Kriegler et al., "The Effect of Hcl and Cle on the Thermal Oxidation of Silicon"; J. Electrochem. Soc: Solid State Science and Technology; vol. 119, No. 3, Mar. 1972, pp. 388-392.

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