Inspection apparatus with improved detection of surface defects

Details Inspection apparatus with improved detection of surface defects Inspection apparatus with improved detection of surface defects

1991-06-28

1993-08-17

Kostak, Victor R.

Facsimile and static presentation processing

Facsimile

Specific signal processing circuitry

358101, 356376, H04N 718

Patent

active

052374041

ABSTRACT:
A surface defect inspection apparatus includes a light radiation source, arranged to oppose a surface to be inspected serving as a mirror surface, for radiating light having a predetermined change pattern toward the surface to be inspected, a camera mechanism for receiving an image of the light radiation source, reflected by the surface to be inspected and forming a received-light image corresponding to the change pattern of the light radiation source, and a discriminator for discriminating a surface defect portion on the surface to be inspected by discriminating a portion whose change pattern is different from the change pattern on the basis of the received-light image formed by the camera mechanism.

REFERENCES:
patent: 4559451 (1985-12-01), Carl
patent: 4629319 (1986-12-01), Clarke et al.
patent: 4742237 (1988-05-01), Ozawa
patent: 4868404 (1989-09-01), Hajime
patent: 5064291 (1991-11-01), Reiser
patent: 5072128 (1991-12-01), Hayano et al.
patent: 5119434 (1992-06-01), Bishop et al.
patent: 5129009 (1992-07-01), Lebeau
PCT Publication No. WO 89/01146 dated Feb. 9, 1989.
Official Office Action date May 20, 1992 issued in the matter of P 4121 464.1-52-Mazda Motor Corporation (with English Translation).

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