Semiconductor tester with remote debugging for handler

Details Semiconductor tester with remote debugging for handler Semiconductor tester with remote debugging for handler

1997-08-18

2000-09-05

Grant, William

Data processing: generic control systems or specific application

Specific application, apparatus or process

Product assembly or manufacturing

700108, G11C 800

Patent

active

061156450

ABSTRACT:
A semiconductor tester at a first station includes a device handler operating under control of a first computer located at the first station. The handler is provided with a video camera having an output connected to a port of the first computer. A second computer, which includes a display monitor, is located at a second station, which is remote from the first station, and the first and second computers are connected in a computer network. The video camera is employed to acquire an image of the handler and the video camera provides the first computer with video data representative of this image. The video data is transmitted over the computer network to the second computer and is provided to the display monitor, whereby the image acquired by the video camera can be viewed on the display monitor. Information regarding operation of the device handler is transmitted from the second station to the first station.

REFERENCES:
patent: 5464313 (1995-11-01), Ohsawa
patent: 5500081 (1996-03-01), Bergman
patent: 5664337 (1997-09-01), Davis et al.
patent: 5769269 (1998-06-01), Peters
patent: 5943437 (1999-08-01), Sumie et al.
patent: 6008061 (1999-12-01), Kasai
patent: 6009039 (1999-12-01), Takamae et al.

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