Optical cut-off filter

Details Optical cut-off filter Optical cut-off filter

1981-03-05

1983-07-26

Arnold, Bruce Y.

G02B 528

Patent

active

043950906

ABSTRACT:
An optical cut-off filter characterized by a multi-layer system comprising of a sequence of dielectric layers which are bordered on each side by a transparent medium having an equal or same index of refraction with the index of refraction of each of the dielectric layers being selected so that for a preselected radiation angle of incidence, the band paths of the filter have an envelope of reflected secondary maximum for a component vibrating perpendicular to the radiation plane of incidence and the envelope for a component vibrating parallel to the radiation of planar incidence of the electrical field vector of incident radiation, and both envelopes exhibit zero locations which have a different wavelength due to the selection of the index of refraction of the dielectric layers forming the filter.

REFERENCES:
H. A. Macleod, Thin-Film Optical Filters, London, Adam Hilger Ltd., 1969, pp. 17-20.
A. N. Elsner, "On the Calculation of Multilayer Interference Coatings with Given Spectral Characteristics," Optics and Spectroscopy, vol. 17, No. 3, Sep. 1964, pp. 238-240.
A. F. Turner and P. W. Baumesiter, "Multilayer Mirrors with High Reflectance Over an Extended Spectral Region," Applied Optics, vol. 5, No. 1, Jan. 1966, pp. 69-76.
O. S. Heavens and Heather M. Liddell, "Staggered Broad-Band Reflecting Multilayers," Applied Optics, vol. 5, No. 3, Mar. 1966, pp. 373-376.

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