Method of estimating the reliability of module circuits

Details Method of estimating the reliability of module circuits Method of estimating the reliability of module circuits

1996-05-22

1998-06-09

Karlsen, Ernest F.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

39518301, G01R 3126

Patent

active

057640734

ABSTRACT:
A method for estimating the reliability of modular circuits by conducting an accelerated life test of components comprising a modular circuit, applying the acceleration factor, etc. on test data thus obtained, and calculating a time to reach a predetermined rate of deterioration as the life time. By adding actual working conditions to the rate of deterioration, a minimum value for determining the deterioration of characteristics is obtained. A component having a value not higher than the minimum value or a rate not lower than the characteristic rate of degradation is then mounted on a printed circuit board comprising the modular circuit, to confirm whether the modular circuit functions normally.

REFERENCES:
patent: 5196354 (1993-03-01), Ohtaka et al.
patent: 5426375 (1995-06-01), Roy et al.

Affiliated with

Also associated with

Rating

Method of estimating the reliability of module circuits does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of estimating the reliability of module circuits, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of estimating the reliability of module circuits will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2204585