Exposure calculation device

Details Exposure calculation device Exposure calculation device

1992-08-26

1993-09-28

Perkey, W. B.

Optics: measuring and testing

Range or remote distance finding

With photodetection

356222, G03B 708, G01J 144

Patent

active

052490157

ABSTRACT:
An exposure calculation device comprises: first composite photometered value calculation apparatus means for classifying areas of divisional photometering means to a first pattern and calculating a composite photometered value for each classified area based on the photometered values of the divisional photometering areas contained in each classified area; first exposure value calculation means for calculating a first exposure value based on the calculated composite photometered value; second composite photometered value calculation means for classifying the areas of the divisional photometering means to a second pattern and calculating a composite photometered value for each classified area based on the photometered values of the divisional photometering areas contained in each classified area; second exposure calculation means for calculating a second exposure value based on the calculated composite photometered value; contribution factor calculation means for calculating contribution factors of the first and second exposure values in accordance with a photographing condition; and third exposure value calculation means for combining the first exposure value and the second exposure value in accordance with the contribution factors calculated by the contribution factors calculation means to calculate an exposure value to control the exposure.

REFERENCES:
patent: 4445778 (1984-05-01), Nakauchi
patent: 5036400 (1991-07-01), Haruki
patent: 5164759 (1992-11-01), Yasukawa
patent: 5184172 (1993-02-01), Miyazaki

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