Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1994-04-15
1996-06-25
Nguyen, Vinh P.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
3241581, 364481, 364490, G01R 3128
Patent
active
055303722
ABSTRACT:
Probe-point placement methods are described. A layout description, a netlist description and a cross-reference description of an IC are retrieved from storage. The data structures associate with each net name a list of polygons. Polygons of a selected net are broken into segments of a specified step size. Each segment is evaluated in accordance with a set of prober rules. Values produced by the prober rules are weighted and combined to obtain a prober score for each segment. The prober score indicates suitability of the corresponding net location for probing. If the best prober score indicates an optimal segment exists for probing, the coordinates of that segment are stored and used to direct a probe to the corresponding location of the IC. If the best prober score indicates no optimal segment exists for probing, each segment of the net is evaluated in accordance with a set of probe-point cutter rules. Values produced by the probe-point cutter rules are weighted and combined to obtain a cutter score for each segment. The cutter score indicates suitability of the corresponding net location for cutting a probe-point hole. A segment having the best cutter score is considered optimal for placing a probe point. The methods can be used, e.g., with electron-beam, focused-ion-beam and laser-beam systems, and with mechanical probe systems.
REFERENCES:
patent: 4706019 (1987-11-01), Richardson
patent: 4721909 (1988-01-01), Richardson
patent: 5140164 (1992-08-01), Talbot et al.
patent: 5392222 (1995-02-01), Noble
D. Rugar et al., Atomic Force Microscopy, Physics Today, Oct. 1990.
R. Scharf et al., DRC-Based Selection of Optimal Probing Points for Chip-Internal Measurements, Proc. Int. Test Conf. 1992, Paper 39.2 (month is unavailable).
P. Garino et al., Automatic Selection of Optimal Probing Points for E-Beam Measurements, EOBT, 1991, Como, Italy (Sep. 1991).
R. Scharf et al., Layout Analysis and Automatic Test Point Selection for Fast Prototype Debug using E-Beam or Laser-Beam Testsystems, IEEE Custom Integrated Circuits Conference (CICC), 1992, Boston, MA, USA. (month is unavailable).
R. Scharf et al., CAPT/IVE: Computer Aided Prototype Testing using an Integrated Verification Environment, Northcon/91, 1991, Portland, OR, USA (month is unavailable).
K. Herrmann et al., Design for e-beam testability--A demand for e-beam testing of future device generations?, Microelectronic Engineering, vol. 7, 1987 (month is unavailable).
W. Lee, Engineering a Device for Electron-Beam Probing, IEEE Design & Test of Computers, vol. 6, 1989, pp. 36-49; A. Noble et al., Increasing Automation in Diagnostic Processes, EE-Evaluation Engineering, vol. 5, 1992 (month is unavailable).
A. Noble et al., Increasing Automation in Diagnostic Processes, EE-Evaluation Engineering, May 1992.
Lee William T.
Soetarman Ronny
Talbot Christopher G.
Hyden Martin D.
Nguyen Vinh P.
Olsen Kenneth
Riter Bruce D.
Schlumberger Technologies Inc.
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