Fishing – trapping – and vermin destroying
Patent
1994-07-20
1996-06-25
Thomas, Tom
Fishing, trapping, and vermin destroying
437 13, 437 40, 437 88, 437174, 437907, 437 21, 148DIG1, 148DIG4, 148DIG16, 148DIG60, 117 8, H01L 21322, H01L 2184, H01L 2126
Patent
active
055299377
ABSTRACT:
After a pattern is transferred on silicon film crystallized by annealing, the silicon film is annealed by radiation of intense rays for a short time. Especially, in the crystallizing process by annealing, an element which promotes crystallization such as nickel is doped therein. The area not crystallized by annealing is also crystallized by radiation of intense rays and a condensed silicon film is formed. After a metal element which promotes crystallization is doped, annealing by light for a short time is performed by radiating intense rays onto the silicon film crystallized by annealing in an atmosphere containing halide. After the surface of the silicon film is oxidized by heating or by radiating intense rays in a halogenated atmosphere and an oxide film is formed on the silicon film, the oxide film is then etched. As a result, nickel in the silicon film is removed.
REFERENCES:
patent: Re28385 (1975-04-01), Mayer
patent: Re28386 (1975-04-01), Heiman et al.
patent: 4226898 (1980-10-01), Ovshinsky et al.
patent: 4231809 (1980-11-01), Schmidt
patent: 4300989 (1981-11-01), Chang
patent: 4331709 (1982-05-01), Risch et al.
patent: 4379020 (1983-04-01), Glaeser et al.
patent: 5043224 (1991-08-01), Jaccodine et al.
patent: 5147826 (1992-09-01), Liu et al.
patent: 5200630 (1993-04-01), Nakamura et al.
patent: 5221423 (1993-06-01), Sugino et al.
patent: 5225355 (1993-07-01), Sugino et al.
patent: 5254480 (1993-10-01), Tran
patent: 5262350 (1993-11-01), Yamazaki et al.
patent: 5262654 (1993-11-01), Yamazaki
patent: 5275851 (1994-01-01), Fonash et al.
patent: 5278093 (1994-01-01), Yonehara
patent: 5296405 (1994-03-01), Yamazaki et al.
patent: 5298075 (1994-03-01), Lagendijk
patent: 5308998 (1994-05-01), Yamazaki et al.
patent: 5313075 (1994-05-01), Zhang et al.
patent: 5403772 (1995-04-01), Zhang et al.
J. M. Green et al., IBM Tech. Discl. Bulletin, 16(5) (1973) 1612 "Method to Purify Semiconductor Wafers".
Y. Kawazu et al., J. J. Appl. Phys., 29, 12 (1990) 2698 "Low Temperature Crystallization of .alpha.-Si:H by NiSi.sub.2 . . . ".
C. Hayzelden et al., J. Appl. Phys., 73, 12 (1993) 8279 ". . . Silicide Mediated Recrystallization of Q-Si:Ni . . . ".
C. Hayzelden et al., Appl. Phys. Lett., 60, 2 (1992) 225 ". . . Silicide Mediated Crystallization of .alpha.-Si".
A. Y. Kuznetsov et al., Inst. Phys. Conf. Ser #134:4, Proceedings Of Royal Microscopical Soc. Conf., 1993, p. 191.
Y. N. Erokhin, et al., Appl. Phys. Lett., 63, 23 (1993) 3173 "Spatially Confined NiSi.sub.2 Formation on . . . Preamorphised Si".
J. Stoemnos et al., Appl. Phys. Lett., 58, 11 (1991) 1196 "Crystallization of Q-Si . . . Utilizing Gold".
J. L. Batstone, et al., Solid State Phenomena, 37-38 (1994) 257 "Microscopic Processes in Crystallization".
A. Y. Kuznetsov, et al., Nucl. Instr. Meth. Phys. Res., B80/81 (1993) 990, "Recrystallization of .alpha.-Si Due to NiSi . . . ".
R. C. Cammarata et al., J. Mater. Res., 5, 10 (1990) 2133 "Silicide Precipitation and Si Crystallization in .alpha.-Si: Ni".
J. J. P. Bruines et al., Appl. Phys. Lett., 50, 9 (1987) 507 ". . . Pulsed Laser Annealing of .alpha.-Si".
T. Hempel, et. al., Solid State Communications, vol. 85, #11, pp. 921-924, Mar. 1993, Received After Mar. 22, 1993.
A. V. Dvurechenskii, et al., Physica Status Solidi, A95, p. 635 (1986).
Ohnuma Hideto
Takemura Yasuhiko
Zhang Hongyong
Butts Karlton C.
Ferguson Jr. Gerald J.
Radomsky Leon
Semiconductor Energy Laboratory Co,. Ltd.
Thomas Tom
LandOfFree
Process for fabricating thin film transistor does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Process for fabricating thin film transistor, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Process for fabricating thin film transistor will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2188453