Temperature pattern measuring method and a device therefor

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364525, 356 45, 358107, G01J 518

Patent

active

044133243

ABSTRACT:
A temperature pattern distribution measuring method and apparatus by which portions of light from parts of an area of an object whose temperature distribution pattern is to be measured, and whose parts are in a predetermined pattern, are passed through first and second optical filters which respectively pass different wavelengths of light. The level of engery passed by the respective filters for the respective portions of light are determined by scanning the light from the filters with a pickup device or devices and, by using the determined energy levels, an arithmetic unit carries out a two-color temperature determining operation for the respective parts of the area for determining the temperature on each part of the area of the object. The temperature pattern of the area of the object can thereby be determined from the temperatures of the parts of the area.

REFERENCES:
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patent: 4168430 (1979-09-01), Denis et al.
patent: 4222663 (1980-09-01), Gebhart et al.
patent: 4254338 (1981-03-01), Abel et al.
patent: 4257106 (1981-03-01), Auer
patent: 4305096 (1981-12-01), Tokoshima et al.
patent: 4326798 (1982-04-01), Kahn

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