Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1993-12-27
1997-03-04
Karlsen, Ernest F.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
324754, G01R 3102
Patent
active
056083351
ABSTRACT:
In a method for the testing of integrated circuits on wafers, the testing is facilitated by setting apart a test circuit zone on the wafer. The test circuit zone comprises contact pads to which it is possible to apply the tips of a tester, and also comprises a demultiplexer to transmit test stimuli to one out of N buses at the output of the demultiplexer. The output buses of the demultiplexer extend between the rows of chips on the wafer. Column selection conductors extend between the columns of chips. The demultiplexer and a decoder, both controlled directly by the tester, enable the selection of one chip at a time for testing. The testing tips are not shifted from one chip to the next one. The wafer is then sliced into individual chips.
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Formby Betty
Groover Robert
Karlsen Ernest F.
Kobert Russell M.
SGS-Thomson Microelectronics S.A.
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