Method and apparatus for detecting cracks in a flip-chip die usi

Radiant energy – Photocells; circuits and apparatus – With circuit for evaluating a web – strand – strip – or sheet

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Details

250307, 250234, G01N 2924

Patent

active

059775556

ABSTRACT:
An apparatus for detecting cracks in a flip-chip die which comprises an emitter (2) coupled to the die (1) for emitting energy along an axis, a probe (3) located on the die for receiving the energy, and a device (19) coupled to the probe for detecting the energy along the axis.

REFERENCES:
patent: 5431055 (1995-07-01), Takata et al.

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