Excavating
Patent
1995-10-06
1997-12-30
Beausoliel, Jr., Robert W.
Excavating
371 211, G06F 1127, G06F 11277
Patent
active
057040338
ABSTRACT:
In an apparatus of testing a program memory for a one-chip microcomputer which allows the test of program memory mounted within the microcomputer and the test of another function block, thereby reducing test time, and the method therefor, the testing apparatus includes a central processing unit (CPU) for controlling the overall system, an interrupt controller for controlling an interrupt function, a data memory for storing information on data, a peripheral unit connected to a main system for performing input and output functions, a program memory for storing each program information having a predetermined pattern, an address counter for setting address of program memory via an address bus line switched by a first switch, a check-sum calculator for calculating and storing the entire data of the set address of program memory via a data bus line switched by a second switch, a test mode switch for controlling first and second switches, and address counter, and an input/output port for inputting or outputting port outputs of the entire data of check-sum calculator and data of the overall system. Tests for various functional blocks except the program memory are simultaneously performed while performing a test for the program memory. Therefore, the test time and the test cost due to large program memories can be reduced.
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Baderman Scott T.
Beausoliel, Jr. Robert W.
LG Semicon Co. Ltd.
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