Device for testing integrated circuits

Details Device for testing integrated circuits Device for testing integrated circuits

1995-03-27

1997-11-25

Karlsen, Ernest F.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324762, G01R 1073

Patent

active

056916515

ABSTRACT:
Device for testing integrated circuits by establishing a connection between the instrument and the circuit's pads, with a test card (1) that has pads or pins (4) on top of the instrument and conductively connected with a large number of contact needles (5) that can be contacted with the pads, whereby the contact needles (5) are secured in a holder (2) that is connected to the card by a fastener that allows at least part of the card (1) to move in relation to the needle holder (2), with the result that the needle holder (2) is extensively mechanically separated from the card (1).

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Patent Abstracts Of Japan, vol. 8, No.1 (P-246)(1438) 6 Jan. 1984: JP-A-58-165056.

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