Electricity: electrical systems and devices – Safety and protection of systems and devices – Load shunting by fault responsive means
Patent
1995-05-30
1996-03-12
Pellinen, A. D.
Electricity: electrical systems and devices
Safety and protection of systems and devices
Load shunting by fault responsive means
361111, 361 91, 257355, H02H 320
Patent
active
054991528
ABSTRACT:
Independently of a punch-through MOS transistor Q.sub.3 used as an I/O protection element in which the drain is connected to an input node or output node and the source is connected to a GND or Vcc, an element for-setting the gate of punch-through MOS transistor Q.sub.3 to the GND potential is provided so that its operating speed may be slower than the punch-through speed of the punch-through MOS transistor Q.sub.3. In consequence, a high surge applied from I/O terminal can be punched through before the gate insulating film of the punch-through transistor Q.sub.3 undergoes a high electric field, to thereby protect the gate insulating film.
REFERENCES:
patent: 4739438 (1988-04-01), Sato
patent: 4937700 (1990-06-01), Iwahashi
patent: 5086365 (1992-02-01), Lien
patent: 5121179 (1992-06-01), Sasaki
Medley Sally C.
NEC Corporation
Pellinen A. D.
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