Method and control circuit for measuring the temperature of an i

Details Method and control circuit for measuring the temperature of an i Method and control circuit for measuring the temperature of an i

1995-06-06

1996-03-12

Wieder, Kenneth A.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

365211, 365222, G01R 3100

Patent

active

054989710

ABSTRACT:
A method and circuit for relatively accurately measuring the die temperature of an IC, such as a microprocessor, by sensing one or more internal circuit elements which have an electrical parameter which varies as a function of temperature, such as an input protection diode. By sensing the one or more circuit elements which have an electrical parameter that is temperature dependent, the method provides a relatively more accurate measurement of the die temperature than measuring the outside temperature of the IC package. In addition, a control circuit is provided for cooling the IC during excessive temperature conditions by slowing down the clock frequency of the IC until the die temperature is within the temperature limit in order to optimize the utility of the IC during excessive temperature conditions.

REFERENCES:
patent: 3835458 (1974-09-01), Mrazek
patent: 4390972 (1983-06-01), Machida

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