Second order correction in linearized proximity probe

Details Second order correction in linearized proximity probe Second order correction in linearized proximity probe

1977-10-11

1980-10-14

Tokar, M.

Electricity: measuring and testing

Conductor identification or location

Inaccessible

324132, 328162, 330109, G01R 2726

Patent

active

042283922

ABSTRACT:
A system for reducing higher order nonlinearities in the linearized output of a dimension gauging probe in which the dimension gauging probe provides an output varying inversely with the physical dimension gauged which is in turn linearized to a signal varying proportionally with the physical dimension. Higher order nonlinearities, an error condition, which deviate the correspondence between the gauged dimension and the output from a linear or straight-line function, are reduced by feedback of the linearized output to the probe and, preferably, by feedforward of a portion of the probe output signal to the linearized signal.

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