Scanning pass test circuit

Details Scanning pass test circuit Scanning pass test circuit

1996-06-18

1997-12-30

Beausoliel, Jr., Robert W.

Excavating

371 225, 39518306, G01R 3128

Patent

active

057038848

ABSTRACT:
A shift register constituting a scanning pass test circuit is divided into a plurality of groups, and bypass selectors are inserted into the divided positions of the shift register. A latch circuit is connected to each of the clock signal terminals of the flip-flop circuits which are disposed at the first stage of the flip-flop circuit groups.

REFERENCES:
patent: 4897837 (1990-01-01), Ishihara et al.
patent: 4942577 (1990-07-01), Ozaki
patent: 5130647 (1992-07-01), Sakashita et al.
patent: 5257267 (1993-10-01), Ishizaka
patent: 5367551 (1994-11-01), Okumura et al.
patent: 5378934 (1995-01-01), Takahashi et al.

Affiliated with

Also associated with

Rating

Scanning pass test circuit does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Scanning pass test circuit, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Scanning pass test circuit will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-209772