Ring oscillator test structure

Details Ring oscillator test structure Ring oscillator test structure

1998-01-05

2000-06-13

Mis, David

Oscillators

With frequency calibration or testing

331 57, 331 64, 331108C, 324 7611, H03B 524, G01R 3100

Patent

active

060754176

ABSTRACT:
An improved oscillator test structure is disclosed. A structure according to one embodiment includes an odd plurality of first transistor pairs formed on a predetermined area of a semiconductor substrate. The transistor pairs are electrically connected in a serial ring. The structure also includes at least one second transistor pair, also formed within the predetermined area on the substrate, but electrically isolated from the odd plurality of first transistor pairs.

REFERENCES:
patent: 4425553 (1984-01-01), LaPierre
Schuster, S.E. et al; "On-Chip Test Circuitry for a 2-ns Cycle, 512--kb CMOS ECL SRAM"; IEEE Journal of Solid-State Circuits; vol. 27; No. 7; Jul. 1992; pp. 1073-1079; 331/57, Jul. 1992.

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