High speed three dimensional imaging method

Optics: measuring and testing – By polarized light examination – With light attenuation

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

356 301, 356375, G01B 1124

Patent

active

061477605

ABSTRACT:
A three-dimensional (3D) surface profile measurement method and apparatus uses projected energy with a known spatially varying wavelength distribution over the surface of objects in a scene. The varying wavelength of the light corresponds to the angle at which the light is emitted from a light source. Given this correspondence, light reflected from the scene can be identified by wavelength as to angle at which it was emitted. Triangulation can then be used to determine the distance to the point in the scene from which the detected light is reflected. When performed over a number of points on the scene, a three-dimensional profile of the scene can be generated.

REFERENCES:
patent: 4864395 (1989-09-01), Tajima
patent: 5157487 (1992-10-01), Tajima
Tajima, Johji "Rainbow Range Finder Principle for Range Data Acquisition" C&C Information Technology Research Laboratories, NEC Corporation 4-4-1, Miyazaki, Miyamai-ku, Kawasaki 213, Japan, 1987 IEEE.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

High speed three dimensional imaging method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with High speed three dimensional imaging method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and High speed three dimensional imaging method will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2070569

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.